E. Rama, M. Ayache, R. Buchty, B. Bauer, M. Korb, M. Berekovic, and S. Mulhem
Trustworthy Integrated Circuits: From Safety to Security and Beyond
IEEE Access, IEEE, 2024, 2,024
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M. Ayache, E. Rama, S. Mulhem, M. Berekovic, and M. Korb
Holistic Framework for Evaluating the Trustworthiness of Integrated Circuits
2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE, Tanger, Morocco 2024, 2,024
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B. Bauer, M. Ayache, S. Mulhem, M. Nitzan, J. Athavale, R. Buchty, and M. Berekovic
On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model
in Computer, vol. 55, no. 9, 99-106, 2022, 2,022
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