Publication
M. Ayache,
E. Rama,
S. Mulhem,
M. Berekovic, and
M. Korb
Holistic Framework for Evaluating the Trustworthiness of Integrated Circuits
2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE, Tanger, Morocco 2024, 2.024
URL, RIS, BibTex
Holistic Framework for Evaluating the Trustworthiness of Integrated Circuits
2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE, Tanger, Morocco 2024, 2.024
URL, RIS, BibTex
Reference
@inproceedings{ARM24,
author = "M. Ayache and E. Rama and S. Mulhem and M. Berekovic and M. Korb",
title = "Holistic Framework for Evaluating the Trustworthiness of Integrated Circuits",
year = 2.024,
booktitle = "2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE, Tanger, Morocco 2024",
url = "https://ieeexplore.ieee.org/abstract/document/10767800"
}