Publication
B. Bauer,
M. Ayache,
S. Mulhem,
M. Nitzan,
J. Athavale,
R. Buchty, and
M. Berekovic
On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model
in Computer, vol. 55, no. 9, 99-106, 2022, 2.022
URL, DOI, RIS, BibTex
On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model
in Computer, vol. 55, no. 9, 99-106, 2022, 2.022
URL, DOI, RIS, BibTex
Reference
@inproceedings{BAM22,
author = "B. Bauer and M. Ayache and S. Mulhem and M. Nitzan and J. Athavale and R. Buchty and M. Berekovic",
title = "On the Dependability Lifecycle of Electrical/Electronic Product Development: The Dual-Cone V-Model",
year = 2.022,
booktitle = "in Computer, vol. 55, no. 9, 99-106, 2022",
doi = "10.1109/MC.2022.3187810",
url = "https://doi.ieeecomputersociety.org/10.1109/MC.2022.3187810"
}