S. Mulhem, C. Ewert, A. Neskovic, A. Poudel, C. Hübner, M. Berekovic, and R. Buchty
Secure Software/Hardware Hybrid In-Field Testing for System-on-Chip
2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE, Tanger, Morocco 2024, 2,024
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