Publication
S. Mulhem,
C. Ewert,
A. Neskovic,
A. Poudel,
C. Hübner,
M. Berekovic, and
R. Buchty
Secure Software/Hardware Hybrid In-Field Testing for System-on-Chip
2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE, Tanger, Morocco 2024, 2.024
URL, RIS, BibTex
Secure Software/Hardware Hybrid In-Field Testing for System-on-Chip
2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE, Tanger, Morocco 2024, 2.024
URL, RIS, BibTex
Reference
@inproceedings{MEN24,
author = "S. Mulhem and C. Ewert and A. Neskovic and A. Poudel and C. Hübner and M. Berekovic and R. Buchty",
title = "Secure Software/Hardware Hybrid In-Field Testing for System-on-Chip",
year = 2.024,
booktitle = "2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE, Tanger, Morocco 2024",
url = "https://ieeexplore.ieee.org/abstract/document/10767817"
}