Publication
A. Nešković,
C. Ewert,
M. Berekovic, and
S. Mulhem
SPARC: Automated Root-Cause Analysis of Pre-Silicon Power Side-Channel Leakage in the Processor Design Flow
IEEE/ACM International Conference on Computer-Aided Design (ICCAD '26), 2.026
URL, RIS, BibTex
SPARC: Automated Root-Cause Analysis of Pre-Silicon Power Side-Channel Leakage in the Processor Design Flow
IEEE/ACM International Conference on Computer-Aided Design (ICCAD '26), 2.026
URL, RIS, BibTex
Reference
@inproceedings{nevskovic2026sparc,
author = "A. Nešković and C. Ewert and M. Berekovic and S. Mulhem",
title = "SPARC: Automated Root-Cause Analysis of Pre-Silicon Power Side-Channel Leakage in the Processor Design Flow",
year = 2.026,
journal = "IEEE/ACM International Conference on Computer-Aided Design (ICCAD '26)",
month = "Nov",
url = "https://arxiv.org/pdf/2607.23218"
}