Staff

M. Sc. Christian Ewert

Photo of Christian Ewert

Research Assistant


Ratzeburger Allee 160
23562 Lübeck
Building 64, Room 115 (2nd Floor)

Email:christian.ewert(at)uni-luebeck.de
Phone:+49 451 3101 6334
Fax:+49 451 3101 6304

Bachelor-/Master-Thesis / Hiwi-Job

RISC-V

For the development of a secure, RISC-V-based processor, we need support and want to bring you on board as a Hiwi. Feel free to talk to me personally or contact me via email.

Curriculum Vitae

Since January 2021:

Research assistant at the Institute of Computer Engineering, University of Lübeck, Germany

October 2018 - December 2020:

M.Sc. Computer Engineering, Leibniz University Hannover, Germany

October 2014 - March 2019:

B.Sc. Informational Technology/Computer Engineering, University Rostock, Germany

Research interests

Lab: Trustworthiness

As a member of the Trustworthiness Lab, I am involved in the development of a secure processor architecture. Through a secure design using cryptographic hardware, the goal is to develop a RISC-V based trustworthy processor that will be resilient to the unwanted access and copying of the design.

For more information, please visit our lab page.

Projects

DAIS - Distributed Artificial Intelligent System

The DAIS project aims to develop distributed artificial intelligence systems for industrial applications. These should be lightweight and energy-efficient as well as provide a trusted and secure execution and communication environment to enable the use of mobile IoT devices in industrial environments.

For more information, please visit our project page.

 

 

 

Publications

[MEN24] Mulhem, S.; Ewert, C.; Neskovic, A.; Poudel, A.; Hübner, C.; Berekovic, M.; Buchty, R.: Secure Software/Hardware Hybrid In-Field Testing for System-on-Chip. 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC), IEEE, Tanger, Morocco 2024 [Paper]
[MME24] Mulhem, S.; Muuss, F.; Ewert, C.; Buchty, R.; and Berekovic, M.: ML-Based Trojan Classification: Repercussions of Toxic Boundary Nets. in IEEE Embedded Systems Letters, IEEE, 2024 [Paper]
[WPE22] Weißbrich, M.; Ewert, C.; Schmidt, K.; Hagenah, D.; Weide-Zaage, K.; Payá-Vayá, G.: SRAM Test Chip for Radiation Experiment. Pan Pacific Symposium 2022, 2022 [Abstract]
[NEP20] Niemann, C.;Ewert, C.;Puttnies, H.;Rethfeldt, M.;Timmermann, D.;Danielis, P.: Modeling Energy Consumption for Task-Offloading Decisions on Mobile and Embedded Devices. 2020 IEEE 2nd Global Conference on Life Sciences and Technologies (LifeTech), 400-404, IEEE, Kyoto, Japan 2020 [Abstract] [Paper]